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0 索取号:O6/E998-2 作者: 出版社:London : Murray, 1994.
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0 索取号:O4/E20031/1 作者:Duncan、 Tom.、 出版社:London : John Murray, 1992
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0 索取号:TN14-53/E801/10 作者:IEEE Symposium on Electron、 Ion、 and Laser Beam Technology (10th : 1969 : Gaithersburg、 Md.)、Marton、 L. (Ladislaus)、 1901-、Institute of Electrical and Electronics Engineers.、American Vacuum Society.、University of Maryland、 College Park.、United States. National Bureau of Standards.、 出版社:San Francisco : San Francisco Press, [c1969].
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0 索取号:F713.5/E200311 作者:Nilson、 Torsten H.、 1949-、 出版社:London ; New York : McGraw-Hill, c1995.
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0 索取号:TN11-53/E701/17 作者:Electronic Components Conference (17th : 1967 : Washington、 D.C.)、Schwartz、 Bernard、 Dr.、Morehouse、 C. K.、Institute of Electrical and Electronics Engineers.、Electronic Industries Association.、 出版社:New York : Institute of Electrical and Electronics Engineers, 1967.
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0 索取号:TN102-53/E801/11 作者:Conference on Electron Device Techniques (11th : 1973 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、 出版社:New York, N.Y. : IEEE, c1973.
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0 索取号:TN1-53/E906 作者:International Symposium on Discharges and Electrical Insulation in Vacuum. (11th : 1984 : Berlin、 Germany)、Akademie der Wissenschaften der DDR. Zentralinstitut für Elektronenphysik、Physikalische Gesellschaft der DDR、Institut "Prüffeld für elektrische Hochleistungstechnik."、Kombinat VEB Elektro-Apparate-Werke Berlin-Treptow、Institute of Electrical and Electronics Engineers、 出版社:Berlin : Academy of Sciences of the GDR, Central Institute of Electron Physics (ZIE) ; New York : [Distributed by] Institute of Electrical and Electronics Engineers, c1984
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0 索取号:TN06-53/E802/1970 作者:Symposium on Reliability (1970 : Los Angeles、 Calif.)、Institute of Electrical and Electronics Engineers.、 出版社:New York, N.Y. : Institute of Electrical and Electronics Engineers, c1970.
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0 索取号:TN06-53/E801/11 作者:International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
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0 索取号:TN06-53/E801/10 作者:International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.
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0 索取号:TN06-53/E801/9 作者:International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.
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0 索取号:O6-62/E992 作者:Kimble、 Margaret G.、 出版社:Dubuque, Iowa : Wm. C. Brown Pulishers, c1994.
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0 索取号:Q1/E20039.4 作者:Raven、 Peter H.、Johnson、 George B. (George Brooks)、 1942-、 出版社:Dubuque, IA : Wm. C. Brown Publishers, c1996.
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0 索取号:TN019.2-7/E801/1975 作者:IEEE MTT-S International Microwave Symposium (1975 : Palo Alto、 Calif.)、Lepoff、 Jack H、Institute of Electrical and Electronics Engineers、 出版社:Piscataway, N.Y. : Institute of Electrical and Electronics Engineers, c1975
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0 索取号:TN019.2/E806/1972 作者:IEEE-GMTT International Microwave Symposium (1972 : Arlington Heights、 IL).、Book、 Eric G.、Institute of Electrical and Electronics Engineers.、IEEE Microwave Theory and Techniques Group.、 出版社:New York : Institute of Electrical and Electronics Engineers, 1972.
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0 索取号:TN-7/E801/1977 作者:International Electrical、 Electronics Conference and Exposition (1977 : Toronto、 Ont.)、Institute of Electrical and Electronics Engineers. Canadian Region.、 出版社:[s.l : IEEE, 1977]
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